Electronically focused time-of-flight powder diffractometers at the intense pulsed neutron source
- 1 August 1989
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 22 (4) , 321-333
- https://doi.org/10.1107/s002188988900289x
Abstract
Two time-of-flight powder diffractometers have operated at the Intense Pulsed Neutron Source (IPNS) since August 1981. These instruments use dedicated microcomputers to focus time-of-flight events so that data from different detectors can be summed into a single histogram. Thus, large multidetector arrays can be employed at any scattering angle from 12 to 157°. This design permits data to be collected over a uniquely wide range of d spacings while maintaining high resolution and count rates. The performance of the two instruments is evaluated by analyzing data from a standard Al2O3 sample by the Rietveld method. These instruments provide the capability for moderate- to high-resolution measurements with the duration of a typical run being a few hours.Keywords
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