Direct evidence of stress-induced site change of H in V observed by the channeling method
- 1 April 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 33 (7) , 5121-5123
- https://doi.org/10.1103/physrevb.33.5121
Abstract
The effect of external stress on the lattice location of H in α- was investigated at room temperature by the channeling method using the reaction B, α)αα. A drastic site change of H from T sites to the displaced-T or 4T configuration was observed when a compressive stress of 7 kg/ (below the elastic limit) was applied along the 〈100〉 direction. With the release of the stress, the H atoms returned to the T sites. The observed stress-induced configuration is believed to be closely connected to the occurrence of an enormous enhancement of diffusivity of H in V under stress.
Keywords
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