Use of LEED Apparatus for the Detection and Identification of Surface Contaminants
- 1 October 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (11) , 4355-4358
- https://doi.org/10.1063/1.1709128
Abstract
A low‐energy electron diffraction (LEED) system has been used to study the energy spectra of Auger electrons from clean and alkali‐covered Ge and Si surfaces. Auger bands characteristic of the substrates were observed for the clean surfaces and the deposition of submonolayer coverages of K and Cs introduced new bands characteristic of the respective alkali. It is shown that a surface impurity in a quantity as small as 0.1 monolayer can be detected and identified by this measurement.This publication has 9 references indexed in Scilit:
- Secondary Emission Studies on Ge and Na-Covered GeJournal of Applied Physics, 1967
- Low energy electron diffraction studies on Ge and Na-covered GeSurface Science, 1967
- Aluminosilicate Alkali Ion SourcesReview of Scientific Instruments, 1966
- Sekundärelektronenemission von Antimon‐Caesium‐ und Wismut‐Caesium‐Schichten verschiedener ZusammensetzungAnnalen der Physik, 1960
- Auger Electron Emission in the Energy Spectra of Secondary Electrons from Mo and WPhysical Review B, 1956
- The Analysis and Purification of Rare Gases by Means of Electric DischargesJournal of Applied Physics, 1954
- Auger Peaks in the Energy Spectra of Secondary Electrons from Various MaterialsPhysical Review B, 1953
- The Determination of Gamma-Ray Energies from Beta-Ray Spectroscopy and a Table of Critical X-Ray Absorption EnergiesReview of Scientific Instruments, 1952
- Structure in the X-RayAbsorption Edges of Solid Potassium ChloridePhysical Review B, 1945