High-resolution double-crystal X-ray diffraction for improved assessment of modulated semiconductor structures
- 1 August 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 174 (1-3) , 88-93
- https://doi.org/10.1016/0039-6028(86)90391-2
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X-ray rocking curve analysis of superlatticesJournal of Applied Physics, 1984
- Photoluminescence of an AlAs/GaAs Superlattice Grown by MBE in the 0.7–0.8 µm Wavelength RegionJapanese Journal of Applied Physics, 1981
- X-ray diffraction study of interdiffusion and growth in (GaAs)n(AlAs)m multilayersJournal of Applied Physics, 1980
- X-ray diffraction from one-dimensional superlattices in GaAs1−xPxcrystalsJournal of Applied Crystallography, 1973