Symmetry of reflexion intensity 10.L. and its connection with the notation of layer sequence of Cdl2 polytypes for a structure analysis application
- 1 January 1980
- journal article
- Published by Walter de Gruyter GmbH in Zeitschrift für Kristallographie - Crystalline Materials
- Vol. 151 (1-2) , 31-48
- https://doi.org/10.1524/zkri.1980.151.1-2.31
Abstract
No abstract availableKeywords
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