Threshold voltage for damage in Si under electron bombardment
- 31 January 1977
- journal article
- Published by Elsevier in Scripta Metallurgica
- Vol. 11 (1) , 47-49
- https://doi.org/10.1016/0036-9748(77)90011-4
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- The dynamic observation of the formation of defects in silicon under electron and proton irradiationPhilosophical Magazine, 1973
- An introduction to high-voltage electron microscopyJournal of Materials Science, 1968