A 200 μm X-ray microbeam spectrometer
- 1 February 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 36 (2) , 222-226
- https://doi.org/10.1016/0168-583x(89)90588-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Applications of fiber technique in the X-ray regionNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
- New progress in X‐ray microscopyJournal of Microscopy, 1985
- A study of the characteristics of trace elements in the hair of Japanese. Reference values and the trace elements patterns for determining normal levels.Nippon Eiseigaku Zasshi (Japanese Journal of Hygiene), 1983
- Influence of surface roughness on the propagation of x rays through capillariesApplied Optics, 1979
- Measurements on an x-ray light pipe at 59 and 144 keVJournal of the Optical Society of America, 1976
- X-ray ’’light pipes’’Applied Physics Letters, 1976
- Atomic form factors, incoherent scattering functions, and photon scattering cross sectionsJournal of Physical and Chemical Reference Data, 1975