Noise spectra of a CW silicon TRAPATT oscillator

1 January 1972

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 60 (1) , 125-126
https://doi.org/10.1109/PROC.1972.8565

Abstract

Noise measurements on a double-sided silicon TRAPATT oscillator have been made and show that the noise is comparable to that of the silicon IMPATT oscillator.

Keywords

SILICON
OSCILLATORS
DIODES
NOISE MEASUREMENT
FREQUENCY
BANDWIDTH
Q MEASUREMENT
VOLTAGE
CURRENT MEASUREMENT
LEAKAGE CURRENT

This publication has 0 references indexed in Scilit: