Secondary electron imaging as an aid to STEM microanalysis
- 1 January 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 10 (3) , 237-245
- https://doi.org/10.1016/0304-3991(82)90044-4
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- An electron microscope study of stainless steel deformed in fatigue and simple tensionPhilosophical Magazine, 1959