Threshold voltage mismatch in short-channel MOStransistors
- 1 September 1994
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 30 (18) , 1546-1548
- https://doi.org/10.1049/el:19940999
Abstract
The threshold voltage matching dependency on device area is investigated for a standard 1.2 µm CMOS technology. A deviation from the linear dependency of the threshold voltage matching on the inverse of the square root of the effective channel area is observed for transistors of 1.2 µm channel length.Keywords
This publication has 1 reference indexed in Scilit:
- Introduction to Robust and Quasi-Robust Statistical MethodsPublished by Springer Nature ,1983