Characterization And Photoconductive Properties Of Highly Oriented Thin Films Of Oxotitanium Phthalocyanine Prepared By Vacuum Deposition Technique

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Abstract
Thin films of oxotitanium phthalocyanine were grown on optical flat PYREX glass substrates at 0.05 – 1.5 nm/s under 2×l0-4Pa. The films were analyzed by X-ray diffraction patterns (XRD) and polarized absorption spectra to reveal a preferred molecular orientation in the films evaporated at 0.05 nm/s, but amorphous nature of the films prepared at higher deposition rates. All the films were changed in the crystallinity to α-form Microcrystals upon exposure to vapor of methylene chloride or tetrahydrofuran. XRD analysis of the vapor-treated films at 0.05 nm/s showed only an intense peak at 2θ = 7.50°, demonstrating that the (010) face of the α-form crystal is highly oriented perpendicularly to the substrate surface. The Molecular orientation was again demonstrated by polarized absorption spectra. The photoconductive behavior of the films was found to depend on the deposition rates as well as on the vapor treatment.