In Situ Spectroscopic Ellipsometry Monitoring of Multilayer Growth Dynamics via Molecular Layer Epitaxy
- 2 March 2001
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 17 (7) , 2137-2142
- https://doi.org/10.1021/la0010065
Abstract
No abstract availableKeywords
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