A new mechanism for high-frequency rectification at low temperatures in point contacts between identical metals
- 15 July 1980
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 37 (2) , 245-248
- https://doi.org/10.1063/1.91841
Abstract
Experimental results are reported of high‐frequency (∼ THz) radiation detection by metal‐metal point contacts at low temperatures as a function of bias voltage. The dominant detection mechanism can be attributed to rectification due to electron‐phonon‐scattering‐induced nonlinearity of the I‐V characteristics, a process not observed before.Keywords
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