Properties of Metallic Nanowires: From Conductance Quantization to Localization
- 24 March 1995
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 267 (5205) , 1793-1795
- https://doi.org/10.1126/science.267.5205.1793
Abstract
Material structures of reduced dimensions exhibit electrical and mechanical properties different from those in the bulk. Measurements of room-temperature electronic transport in pulled metallic nanowires are presented, demonstrating that the conductance characteristics depend on the length, lateral dimensions, state and degree of disorder, and elongation mechanism of the wire. Conductance during the elongation of short wires (length l ∼ 50 angstroms) exhibits periodic quantization steps with characteristic dips, correlating with the order-disorder states of layers of atoms in the wire predicted by molecular dynamics simulations. The resistance R of wires as long as l ∼ 400 angstroms exhibits localization characteristics with In R(l) ∼ l2.Keywords
This publication has 19 references indexed in Scilit:
- Theory of conduction through narrow constrictions in a three-dimensional electron gasPhysical Review B, 1994
- One-atom point contactsPhysical Review B, 1993
- Atomic-scale connective neck formation and characterizationPhysical Review B, 1993
- Jump to contact, neck formation, and surface melting in the scanning tunneling microscopePhysical Review Letters, 1993
- Magnetic-flux-induced conductance steps in microwiresPhysical Review B, 1993
- Effects of channel opening and disorder on the conductance of narrow wiresPhysical Review B, 1990
- Quantization of the conductance of ballistic point contacts beyond the adiabatic approximationPhysical Review B, 1990
- Conductance determined by transmission: probes and quantised constriction resistanceJournal of Physics: Condensed Matter, 1989
- Theory of a single-atom point source for electronsPhysical Review Letters, 1989
- Orientational wetting behavior of a liquid-crystal homologous seriesPhysical Review Letters, 1989