Point defect and diffusion properties in oxides from high temperature creep
- 1 January 1983
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 75 (1) , 309-315
- https://doi.org/10.1080/00337578308224714
Abstract
A study of high temperature creep properties of non-stoichiometric CU2O, CoO and NiO has been performed at various temperatures and oxygen activities (Po 2). Creep rates are directly related to point defects responsible for the diffusion of the slowest species. These point defects have been tentatively identified by the Po2 dependence of creep rate which does not depend on the detailed mechanism of deformation.Keywords
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