Transmission electron-microscope observations of the structure of electrolytically deposited copper and its annealing behaviour
- 31 July 1964
- journal article
- Published by Elsevier in Electrochimica Acta
- Vol. 9 (7) , 925-928
- https://doi.org/10.1016/0013-4686(64)85043-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Wide stacking faults in high purity copper crystalsPhilosophical Magazine, 1961
- The interfacial energy of coherent twin boundaries in copperPhilosophical Magazine, 1961
- A kinematical theory of diffraction contrast of electron transmission microscope images of dislocations and other defectsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1960