A new domain for image analysis: VLSI circuits testing, with Romuald, specialized in parallel image processing
- 1 July 1983
- journal article
- Published by Elsevier in Pattern Recognition Letters
- Vol. 1 (5-6) , 347-352
- https://doi.org/10.1016/0167-8655(83)90074-0
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A method for detecting structure in polygonsPattern Recognition, 1981
- Computer analysis and recognition of two-dimensional linear geometrical picturesComputers & Graphics, 1980
- Digital Pattern Recognition by MomentsJournal of the ACM, 1962