Compensator inhomogeneity in an extrinsic semiconductor
- 1 February 1981
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 52 (2) , 840-847
- https://doi.org/10.1063/1.328425
Abstract
No abstract availableThis publication has 37 references indexed in Scilit:
- Laser Scanning Technique for the Detection of Resistivity and Lifetime Inhomogeneities in Semiconductor DevicesPhysica Scripta, 1978
- Analysis of symmetrical Van der Pauw structures with finite contactsSolid-State Electronics, 1978
- Shubnikov—de Haas Oscillations in a Semiconductor SuperlatticePhysical Review Letters, 1977
- Semiconductor profiling using an optical probeSolid-State Electronics, 1975
- Hall Effect of an Inhomogeneous MaterialJournal of Applied Physics, 1972
- Effect of Surface Treatments on Silicon Hall MeasurementsJournal of Applied Physics, 1969
- Effect of Hole-Hole Scattering on the Mobility of-Type GermaniumPhysical Review B, 1962
- Analysis of Lattice and Ionized Impurity Scattering in-Type GermaniumPhysical Review B, 1962
- Quantitative photovoltaic evaluation of the resistivity homogeneity of germanium single crystalsSolid-State Electronics, 1960
- Hall Effect and Conductivity in Porous MediaJournal of Applied Physics, 1956