IIIB-1 degradation of 77-K MOSFET characteristics due to channel hot electrons
- 1 December 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 31 (12) , 1970
- https://doi.org/10.1109/T-ED.1984.21849
Abstract
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