Quantitative depth profile analysis of high-Tc-superconductors with sputtered neutral mass spectrometry (SNMS)
- 1 January 1989
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 333 (4-5) , 343-345
- https://doi.org/10.1007/bf00572324
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- New layer structures in the La–Cu–O systemNature, 1987
- Photoemission on the highT c superconductors Y?Ba?Cu?OZeitschrift für Physik B Condensed Matter, 1987
- Quantitative chemical surface, in-depth, and bulk analysis by secondary neutrals mass spectrometry (SNMS)Journal of Vacuum Science & Technology A, 1985