Optical Methods for Negative Ion Studies

Abstract
A high vacuum crossed-beam apparatus for the study of photodetachment of electrons from negative ions is described, with emphasis on (1) the optical system which transmits a filtered high intensity photon beam, (2) a high transmission mass selector and associated ion optics, and (3) the sensitive ac preamplifier, amplifier, and phase sensitive detector used for measuring the photodetached electron current. The methods used for calibrating and operating the apparatus are discussed.

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