Determination of short-term error caused by the reference clock in precision time-interval measurement and generation
- 1 June 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 37 (2) , 315-316
- https://doi.org/10.1109/19.6074
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Computer Simulation of the Conventional Clock ModelIEEE Transactions on Instrumentation and Measurement, 1979
- Two vernier time-interval digitizersNuclear Instruments and Methods, 1971
- Characterization of Frequency StabilityIEEE Transactions on Instrumentation and Measurement, 1971
- Vernier chronotron reflexNuclear Instruments and Methods, 1970
- Statistics of atomic frequency standardsProceedings of the IEEE, 1966