Microstructure of Implanted and Rapid Thermal Annealed Semi‐Insulating Polycrystalline Oxygen‐Doped Silicon
- 1 April 1987
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 134 (4) , 998-1003
- https://doi.org/10.1149/1.2100612