Structure of cross-tie wall in thin Co films resolved by magnetic force microscopy
- 17 June 1996
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 68 (25) , 3635-3637
- https://doi.org/10.1063/1.115754
Abstract
We have studied the magnetic domain structure of a thin polycrystalline Co film by magnetic force microscopy (MFM). Domain walls of the cross-tie type have been observed for a Co film of 50 nm thickness. Due to the high lateral resolution of MFM we have been able to study the magnetic structure of a single cross tie. We have determined locations of Bloch lines within a domain wall comparing the experimental data with a theoretical model of a cross-tie wall. In order to explain our experimental results we have proposed a model for the interaction between a MFM tip and a cross-tie wall.Keywords
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