Microprocessor-controlled photometric evaluation of high-speed cinematographic films
- 1 March 1979
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 12 (3) , 201-204
- https://doi.org/10.1088/0022-3735/12/3/015
Abstract
To evaluate cinematographic films of the growth of slip lines on metal crystals during tensile deformation an inexpensive device controlled by a microprocessor has been designed. During evaluation the system corrects for frame-to-frame movement of the object, measures the photographic density, corrects for the sensitometric curve of the film and integrates across the intensity distribution of the slip line.Keywords
This publication has 3 references indexed in Scilit:
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- Study of slip band development on neutron-irradiated copper single crystals by high speed cinematographyActa Metallurgica, 1974
- Kinematographie von gleitlinien auf Al-EinkristallenActa Metallurgica, 1953