Frequency-dependent loss in amorphous semiconductors

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Abstract
Recent developments in the theoretical analysis and experimental study of frequency-dependent loss by relaxation in amorphous semiconductors are reviewed. A unified theoretical treatment of the complex a.c. conductivity is given, within the pair approximation, for single electron tunnelling and hopping in both uncorrelated and strongly correlated cases, and the discussion is then extended to pair processes and to atomic relaxation. The problems associated with measuring the frequency dependent conductivity of amorphous samples are considered, and relevant measurements reported for the different classes of amorphous semiconductors, tetrahedral and group V materials and chalcogenides are reviewed in the light of the available theoretical models. The similarity in the magnitudes and frequency, temperature and electric field dependences of the losses observed in many different systems at liquid helium temperatures is noted, and the possible physical reasons for this are examined.

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