Stress measurement by X-ray diffraction using film techniques

• 1 July 1974
• journal article
• Published by Wiley in Strain
• Vol. 10  (3) , 111-116
• https://doi.org/10.1111/j.1475-1305.1974.tb00099.x

Abstract

Keywords

• STRESS MEASUREMENT
• RESIDUAL STRESS
• HARDENED
• SECOND METHOD
• DIFFRACTION
• FILM
• ASYMMETRY
• ERRORS