Microwave surface resistance of YBa2Cu3Cu3O7−x films on polycrystalline ceramic substrates with textured buffer layers
- 9 September 1996
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 69 (11) , 1626-1628
- https://doi.org/10.1063/1.117052
Abstract
We have used a parallel‐plate resonator technique to measure the microwave surface resist‐ ance Rs of YBa2Cu3O7−x (YBCO) films on buffered ceramic substrates at around 10 GHz, and studied the correlation between their Rs and materials properties. A 0.4‐μm‐thick YBCO film (with an in‐plane mosaic spread of 7°) grown on a polycrystalline alumina substrate with an ion‐beam‐assisted‐deposited yttria‐stabilized zirconia buffer layer showed an Rs of 1.89 mΩ at 76 K and 0.21 mΩ at 4 K. We have observed a strong correlation between the Rs of the samples and the in‐plane mosaic spread of the YBCO films. This correlation can be explained qualitatively in terms of a simple model in which the weak links between the grains of the YBCO film form an electrical network of Josephson junctions.Keywords
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