Critical assessment of thickness-dependent conductivity of thin metal films
- 1 November 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 85 (2) , 147-167
- https://doi.org/10.1016/0040-6090(81)90627-1
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Size quantization of electronic states in very thin platinum filmsZeitschrift für Physik B Condensed Matter, 1980
- Resistivity and Temperature Coefficient of Thin Metal Films with Rough SurfaceJapanese Journal of Applied Physics, 1970
- Statistical Model for the Size Effect in Electrical ConductionJournal of Applied Physics, 1967
- The mean free path of electrons in metalsAdvances in Physics, 1952