Wide angle X-ray diffraction topography of polycrystalline materials

1 January 1999

proceedings article
Published by AIP Publishing

p. 655-660
https://doi.org/10.1063/1.1302070

Abstract

X-ray topography is characterized by the spatially resolved detection of scattering of a material. The advantages of radiographic imaging can be combined with the analytical information revealed by Wide Angle X-Ray Diffraction. Beyond the limitations of the well-known Single Crystal Topography new approaches by single beam scanning techniques under pre-selected scattering conditions permit the topographic characterization of polycrystalline or amorphous solids or liquids. The principles of different topographic methods and their application to polymer and ceramic composites are presented.

Keywords

NONDESTRUCTIVE TESTING
MATERIALS SCIENCE
X RAY DIFFRACTION
SOLIDS
COMPOSITE MATERIALS
SINGLE CRYSTAL
CERAMICS
FIBERS
TEXTURE
SURFACES
POLYMERS

This publication has 0 references indexed in Scilit: