Complete high-frequency measurement of Mueller matrices based on a new coupled-phase modulator
- 1 July 1997
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 68 (7) , 2671-2680
- https://doi.org/10.1063/1.1148178
Abstract
No abstract availableKeywords
This publication has 33 references indexed in Scilit:
- Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2Journal of the Optical Society of America A, 1996
- Measurement of the Mueller scattering matrix by use of optical beats from a Zeeman laserApplied Optics, 1994
- Phase modulated ellipsometry from the ultraviolet to the infrared: In situ application to the growth of semiconductorsProgress in Crystal Growth and Characterization of Materials, 1993
- Mueller matrix dual-rotating retarder polarimeterApplied Optics, 1992
- Stokes vectors, Mueller matrices, and polarized scattered lightAmerican Journal of Physics, 1985
- Recent developments in instrumentation in ellipsometrySurface Science, 1980
- Measurement of polarized light interactions via the Mueller matrixApplied Optics, 1980
- Mueller matrix ellipsometry with imperfect compensatorsJournal of the Optical Society of America, 1978
- Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signalOptics Letters, 1978
- A new polarization-modulated light scattering instrumentReview of Scientific Instruments, 1973