Correction of X-Ray Diffraction Intensities for Lorentz and Polarization Factors

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Abstract
In crystal structure determination, it is necessary to apply corrections for Lorentz and polarization factors to the intensities of the x‐ray diffraction spectra. Such corrections usually appear to take complicated form. It is shown that Lorentz factors can all be reduced to the comparatively simple form, L=(1/S)·(1/sin Υ), where S is a scale factor, constant for a particular recorded level of the reciprocal lattice, but differing in form depending on the method of recording. The factor can be eliminated from subsequent computation of corrections by proper timing of the photographs of the levels of the reciprocal lattice, and then all photographs have the same simple Lorentz correction, namely sin Υ. The polarization factor, on the other hand, depends only on the reciprocal lattice coordinate, σ, and is independent of method of recording. Six tables are provided for simplifying the routine computation of Lorentz and polarization corrections, and the methods advocated for correction are illustrated by examples.

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