Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks
- 1 November 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-20 (11) , 1252-1257
- https://doi.org/10.1109/t-c.1971.223124
Abstract
The important problem of generating test patterns to detect multiple faults has received little attention, mainly due to their computational complexity. The theoretical results of this paper show that near minimal tests for multiple faults can be generated with complexity of computation comparable to that of single faults.Keywords
This publication has 5 references indexed in Scilit:
- Analyzing Errors with the Boolean DifferenceIEEE Transactions on Computers, 1968
- Programmed Algorithms to Compute Tests to Detect and Distinguish Between Failures in Logic CircuitsIEEE Transactions on Electronic Computers, 1967
- On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic NetsIEEE Transactions on Electronic Computers, 1966
- Derivation of optimum test sequencies for sequential machinesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1964
- The Diagnosis of Asynchronous Sequential Switching SystemsIEEE Transactions on Electronic Computers, 1962