Optical fiber and preform profiling technology
- 1 October 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 18 (10) , 1451-1466
- https://doi.org/10.1109/jqe.1982.1071398
Abstract
No abstract availableThis publication has 63 references indexed in Scilit:
- Practical three-dimensional profiling of optical fiber preformsIEEE Journal of Quantum Electronics, 1982
- Three-dimensional fibre preform profilingElectronics Letters, 1981
- Measurement of axially nonsymmetrical refractive-index distributions of optical fiber preforms by a triangular mask methodApplied Optics, 1981
- Holographic measurement of refractive-index profile in the transition region of an optical fiber preformApplied Optics, 1981
- Nondestructive measurement of refractive-index profile and cross-sectional geometry of optical fiber preformsApplied Optics, 1980
- Automated Measurement of Refractive Index Profile of VAD Preforms by Fringe-Counting MethodJournal of Optical Communications, 1980
- Nondestructive determination of refractive-index profile and cross-sectional geometry of optical-fibre preformElectronics Letters, 1979
- Nondestructive refractive-index profile measurement of elliptical optical fibre or preformElectronics Letters, 1979
- Elimination of errors due to sample polishing in refractive index profile measurements by interferometryReview of Scientific Instruments, 1976
- Refractive Index Profile Measurements of Diffused Optical WaveguidesApplied Optics, 1974