An Ultra-High Resolution Frequency Meter
- 1 January 1981
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 464-469
- https://doi.org/10.1109/freq.1981.200513
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Modified "Allan Variance" with Increased Oscillator Characterization AbilityPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- Algorithm for fast digital analysis of interference fringesApplied Optics, 1980
- Characterization of frequency stabilityPublished by National Institute of Standards and Technology (NIST) ,1970