The effect of variations in objective focal length on electron microscope performance
- 1 December 1975
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 105 (3) , 277-282
- https://doi.org/10.1111/j.1365-2818.1975.tb04060.x
Abstract
Standard specimens were examined in a transmission electron microscope with a top entry stage. Using a range of objective focal lengths, measurements of contrast, resolution and magnification range were made. Focal lengths up to 14 mm were examined. The contrast was found to increase with increasing focal length, being twelve and a half times greater at 14 mm focal length than at the normal high resolution mode of 2 mm focal length. Resolution, determined by the fresnel fringe method decreased from 0·3 nm to 3·5 nm. The photographic image magnification was reduced from × 1000– × 500,000 at 2 mm focal length to ×100‐× 50,000 at 14 mm focal length.This publication has 3 references indexed in Scilit:
- High Quality Wide Field Imaging with JEM-100BProceedings, annual meeting, Electron Microscopy Society of America, 1972
- A distortion‐free low‐magnification stage for the Hitachi HU‐11B electron microscopeJournal of Microscopy, 1971
- A test object and criteria for high resolution electron microscopyJournal of Applied Crystallography, 1968