A Technique For Measuring Vertically And Horizontally Polarized Microwave Brightness Temperatures Using Electronic Polarization-basis Rotation
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 1569-1572
- https://doi.org/10.1109/igarss.1990.688806
Abstract
No abstract availableKeywords
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