X-Ray Diffraction Studies and Ellipsometric Diagnostics of Thin α-Ti Growth Films in Plasma Activated Physical Vapour Deposition
- 1 July 1994
- journal article
- Published by Trans Tech Publications, Ltd. in Materials Science Forum
- Vol. 166-169, 313-318
- https://doi.org/10.4028/www.scientific.net/msf.166-169.313
Abstract
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