Dynamic testing of high-speed A/D converters

• 1 June 1978
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
• Vol. 13  (3) , 368-371
• https://doi.org/10.1109/jssc.1978.1051056

Abstract

Keywords

• A/D CONVERTERS
• DYNAMIC TESTING
• SPEED A/D
• TESTING OF HIGH
• OPERATING CONDITIONS
• HIGH SPEED
• PROPOSED DIGITAL
• DIGITAL TECHNIQUES