Extension of High-Temperature Electronics
- 1 December 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 2 (4) , 399-404
- https://doi.org/10.1109/tchmt.1979.1135491
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The Analysis of Data from Accelerated Stress Tests8th Reliability Physics Symposium, 1971