Formulation of Admittance for Parallel Field Excitation of Piezoelectric Plates
- 1 August 1970
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 41 (9) , 3604-3609
- https://doi.org/10.1063/1.1659478
Abstract
Parallel field excitation of piezoelectric plates has been analyzed with a matrix method, and the admittance of the plate is derived. This formulation affords the definition of coupling factor to each of three vibrational modes, which is shown to be modified by the antifield effect due to the induced charges on major surfaces of the plate in case of anisotropic crystals. In contrast to the perpendicular field excitation case, the resonant frequencies in this case are odd multiples of the fundamentals and the antiresonant frequencies are determined as solutions of a transcendental equation. The validity of the derived equations is confirmed by comparing measured and calculated frequency constants of lithium tantalate single crystal.This publication has 6 references indexed in Scilit:
- Elastic and Piezoelectric Constants of Ba2NaNb5O15Journal of Applied Physics, 1969
- Piezoelectric and Elastic Properties of LiTaO3: Temperature CharacteristicsJapanese Journal of Applied Physics, 1969
- Determination of Elastic and Piezoelectric Constants for Crystals in Class (3m)The Journal of the Acoustical Society of America, 1967
- ELASTIC, PIEZOELECTRIC, AND DIELECTRIC PROPERTIES OF LITHIUM TANTALATEApplied Physics Letters, 1967
- Thickness Vibrations of Piezoelectric PlatesThe Journal of the Acoustical Society of America, 1963
- Dynamical Determinitation of the Elastic Constants and Their Temperature Coefficients for QuartzPhysical Review B, 1941