Extended behavioral decomposition for estimating ultrahigh reliability
- 1 April 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 40 (1) , 22-28
- https://doi.org/10.1109/24.75328
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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