Wavelet transform as a processing tool in white-light interferometry
- 15 July 1997
- journal article
- Published by Optica Publishing Group in Optics Letters
- Vol. 22 (14) , 1065-1067
- https://doi.org/10.1364/ol.22.001065
Abstract
Results of the application of wavelet transform for signal processing in white-light interferometry are reported. The mother wavelet frequency is chosen to be the light-source correlogram 1’s, and accurate phase measurements are obtained from simple correlation computations. The fringe envelope is also addressed and permits a complete analysis of coherence-limited fringe patterns. Miscalibrations of phase shift and mean wavelength are also considered.Keywords
This publication has 9 references indexed in Scilit:
- Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometryJournal of Modern Optics, 1997
- A Review of Recent Developments in Fiber Optic Sensor TechnologyOptical Fiber Technology, 1996
- Efficient nonlinear algorithm for envelope detection in white light interferometryJournal of the Optical Society of America A, 1996
- Optical coherence tomographyJournal of Biomedical Optics, 1996
- Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency DomainJournal of Modern Optics, 1995
- High-speed noncontact profiler based on scanning white-light interferometryApplied Optics, 1994
- Determination of the phase change on reflection from two-beam interferenceOptics Letters, 1994
- Interferometric profiler for rough surfacesApplied Optics, 1993
- An Application Of Interference Microscopy To Integrated Circuit Inspection And MetrologyPublished by SPIE-Intl Soc Optical Eng ,1987