Fault detection of combinational circuits based on supply current

6 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 374-380
https://doi.org/10.1109/test.1988.207824

Abstract

A new fault detection technique is proposed which can detect logical faults in combinational circuits by measuring the supply current instead of the output logic, and the effectiveness is evaluated by experiments of the circuits made of TTL IC's. This technique is based on the characteristics that the supply current will be changed by faults in the logic circuits. In this technique, a generation mechanism of current variation is represented by Auto-regressive model, and faults are detected by using pattern recognition methods.

Keywords

GENERATION MECHANISM
SUPPLY CURRENT
NEW FAULT DETECTION TECHNIQUE
LOGICAL FAULT
CURRENT VARIATION
AUTO-REGRESSIVE MODEL
LOGIC CIRCUIT
OUTPUT LOGIC
COMBINATIONAL CIRCUIT
TTL IC
TTL
COMBINATIONAL CIRCUITS
FAULT DETECTION
PATTERN RECOGNITION
LOGIC CIRCUITS
AUTOREGRESSIVE MODEL
TRANSISTOR TRANSISTOR LOGIC

This publication has 1 reference indexed in Scilit:

Power spectrum estimation through autoregressive model fitting
Annals of the Institute of Statistical Mathematics, 1969