Transient SIMS depth-profiles at the interface Si3N4/GaAs
- 1 June 1984
- journal article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 319 (6-7) , 855-860
- https://doi.org/10.1007/bf01226790
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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