Current-Voltage Characteristics of Dielectric Films
- 1 February 1966
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (2) , 599-601
- https://doi.org/10.1063/1.1708222
Abstract
The current‐voltage characteristic of insulating films is usually regarded as being due to quantum‐mechanical tunneling for very thin films, and as being space‐charge‐limited for thicker films. Using an electronic model of a dielectric which was first introduced to explain dielectric breakdown, the current‐voltage characteristic is derived taking explicit account of field emission from the cathode and space‐charge buildup in the body of the dielectric. The characteristic is non‐Ohmic and dependent on thickness and temperature.This publication has 8 references indexed in Scilit:
- Potential Barriers and Emission-Limited Current Flow Between Closely Spaced Parallel Metal ElectrodesJournal of Applied Physics, 1964
- Volume-controlled current injection in insulatorsReports on Progress in Physics, 1964
- Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963
- Electron Transport Mechanisms in Thin Insulating FilmsPhysical Review B, 1962
- Volt-current characteristics for tunneling through insulating filmsJournal of Physics and Chemistry of Solids, 1962
- Schottky Emission Through Thin Insulating FilmsPhysical Review Letters, 1962
- Space-Charge-Limited Currents in SolidsPhysical Review B, 1955
- On the theory of dielectric breakdown in solidsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1947