Characterization of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry
- 1 April 1992
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 210-211, 601-605
- https://doi.org/10.1016/0040-6090(92)90352-c
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- An optical biosensor principle based on fluorescence energy transferThin Solid Films, 1992
- Characterization and optimization of langmuir‐blodgett films containing polymer‐bound fluorophoresAdvanced Materials, 1991
- High mass resolution surface imaging with a time-of-flight secondary ion mass spectroscopy scanning microprobeJournal of Vacuum Science & Technology A, 1991
- Design and performance of a reflectron based time-of-flight secondary ion mass spectrometer with electrodynamic primary ion mass separationJournal of Vacuum Science & Technology A, 1987