Asymmetric Conduction in Thin Film Tantalum/Tantalum Oxide/Metal Structures: Interstitial and Substitutional Impurity Effects and Direct Detection of Flaw Breakdown
- 1 January 1969
- journal article
- Published by The Electrochemical Society in Journal of the Electrochemical Society
- Vol. 116 (4) , 460
- https://doi.org/10.1149/1.2411903