A System with Two Kinds of 3-State Elements

1 October 1980

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability

Vol. R-29 (4) , 345
https://doi.org/10.1109/tr.1980.5220868

Abstract

This paper presents a mathematical model of two types of 3-state devices forming a series configuration. Laplace transforms of the state probability equations are developed.

Keywords

DEGRADATION
MATHEMATICAL MODEL
VALVES
HAZARDS
LAPLACE EQUATIONS
SWITCHES
TELLURIUM
RELIABILITY THEORY
FLUID FLOW
DIODES

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