Dielectric constants and indices of refraction of Xe, Kr, and Ar
- 15 January 1970
- journal article
- Published by Canadian Science Publishing in Canadian Journal of Physics
- Vol. 48 (2) , 244-245
- https://doi.org/10.1139/p70-033
Abstract
Dielectric constants of Xe, Kr, and Ar have been measured at the boiling point, the melting point, and in the solid phase. They are compared, using Maxwell's relation, with the indices of refraction measured at these points by the same author.Keywords
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